Apples-to-Apples PCB Laminate Characterization
Wed. January 30| 2:50 PM - 3:30 PM | Ballroom D
Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass
Track: 05. Advances in Materials & Processing for PCBs, Modules & Packages
Audience Level: All
Session Type: Technical Session
How does an engineer ensure that they have an "apples-to-apples" comparison across multiple laminate systems, constructions, and data sources?
In this paper we demonstrate a quick and direct method of acquiring actual dielectric constant (Dk) and loss tangent (Df) values from the same materials that will be used by your fabricator. This replaces guesswork and blind faith with actual values acquired from your own bench.
It's so easy to measure reliable dielectric constant (Dk)
and loss tangent (Df) of copper clad laminate (CCL)
materials that material uncertainties can be taken off the
table, relative to signal- and power-integrity analysis.
2. The exact same (apples-to-apples) Dk and Df test method can be
used to compare and select laminates; to acquire actual Dk
and Df values for design; and to monitor the supply chain