Exploring 56/112-Gbps Copper Interconnect Metrics Comparing Classic Methods with COM

Wed. January 30| 2:00 PM - 2:40 PM | Ballroom C

Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass

Track: 14. Modeling & Analysis of Interconnects

Audience Level: All

Session Type: Technical Session

Description: As the Datacomm Industry focus moves on from 25G-NRZ to 56/112G-PAM4, the complex nature of the solution space encountered with advanced high speed signaling may not be fully mapped using Classic signal-in-noise detection parameters. A more refined solution topology is explored through the addition of COM analysis.



Deliverables of this study will include full channel assessments using Classic and COM tools with a map of their performance intersection. These performance studies will be conducted at 56G and 112G-PAM4 data rates. Best-fit regression plots will be shared to view Classic to COM agreement as well as Eye Mask and BER Verification Testing.

Takeaway: Advanced high-speed copper signaling is moving up to 56/112G-PAM4 data rates. The solution space encountered with 56/112G-PAM4 signaling may not be fully mapped using Classic signal-in-noise metrics. A more refined solution topology is explored through the addition of COM analysis and best-fit regression plots.


Speakers

David Brunker

David Brunker

Technical Fellow

Molex

Role: Author

Chris Roth

Chris Roth

Signal Integrity Engineer

Molex

Role: Speaker

Mike Resso

Mike Resso

Signal Integrity Applications Scientist

Keysight

Role: Author

Robert Schaefer

Robert Schaefer

R&D Project Manager

Keysight

Role: Speaker

OJ Danzy

OJ Danzy

Signal Integrity Engineer

Keysight

Role: Author

Brent Hatfield

Brent Hatfield

New Product Development Manager

Molex

Role: Author

Joe Dambach

Joe Dambach

New Product Development Manager

Molex

Role: Author

Michael Rost

Michael Rost

Engineering Manager SI

Molex

Role: Author

Vivek Shah

Vivek Shah

Global Engineering Director SI

Molex

Role: Author