How the Braid Impedance of Instrumentation Cables Impact PI & SI Measurements

Thu. January 31| 11:00 AM - 11:45 AM | Ballroom G

Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass

Track: 13. Applying Test & Measurement Methodology

Audience Level: Intermediate

Session Type: Technical Session

Description: VNA instrumentation cables have a direct impact on low frequency, high dynamic range measurements. In this paper we explain this phenomena in the context of power integrity measurements. DC resistance and low frequency transfer impedance are relevant cable metrics which are shown to correlate with the measurement dynamic range.

Takeaway: 1. An appreciation for typical errors in PI measurements
2. An appreciation that VNA cable shielding matters for low frequency, wide dynamic range applications
3. An understanding of transfer impedance and it's impact on S-parameter measurements.


Speakers

Jim Nadolny

Jim Nadolny

Engineering Manager

Samtec

Role: Author

Istvan Novak

Istvan Novak

Samtec

Role: Speaker

Ethan Koether

Ethan Koether

Hardware Engineer

Oracle

Role: Author

Gary Biddle

Gary Biddle

SI Engineer

Samtec

Role: Author