S-Parameter Measurement & Fixture De-Embedding Variation Across Multiple Teams, Equipment & De-embedding Tools

Wed. January 30| 11:00 AM - 11:45 AM | Ballroom D

Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass

Track: 13. Applying Test & Measurement Methodology

Audience Level: All

Session Type: Technical Session

Description: S-parameter measurement and fixture de-embedding are critical tasks especially when measurements and models are shared across multiple teams. In this session we will present a review of best practices for VNA measurements and fixture de-embedding. We will also present the results of a study performed in the context of the IEEE P370 standard analyzing the variation of results across multiple teams for the measurement and fixture de-embedding of the same set of PCB test coupons.

Takeaway: Best practices for the reliable and repeatable measurement of S-parameters with a VNA and fixture de-embedding.


Speakers

Jose Moreira

Jose Moreira

Senior Staff Engineer

Advantest

Role: Author

Heidi Barnes

Heidi Barnes

Senior Application Engineer

Keysight Technologies

Role: Speaker

Jason Ellison

Jason Ellison

Sr. Staff Signal Integrity Engineer

Amphenol

Role: Speaker

Jim Nadolny

Jim Nadolny

NA

Samtec

Role: Author

Al Neves

Al Neves

CTO

Wild River Technology

Role: Author

Ching-Chao Huang

Ching-Chao Huang

President

Ataitec

Role: Author

Eric Bogatin

Eric Bogatin

Dean

Teledyne LeCroy Signal Integrity Academy

Role: Speaker

Patrick Murray

Patrick Murray

Field Application Engineer

Anritsu

Role: Author

Mikheil Tsiklauri

Mikheil Tsiklauri

Research Associate Professor, EMC Laboratory

Missouri University of Science and Technology

Role: Author

Neil Jarvis

Neil Jarvis

Applications Engineer

Rohde & Schwarz

Role: Author