Tutorial – A Practical Guide to Channel Operating Margin (COM) & Effective Return Loss (ERL) Measurements

Tue. January 29| 9:00 AM - 11:50 AM | Ballroom C

Pass Type: All Access Pass, Alumni All Access Pass

Track: 13. Applying Test & Measurement Methodology

Audience Level: All

Session Type: Tutorial

Description: COM and ERL Measurements have become common in the high-speed Ethernet standards and will soon be appearing in new computer bus standards such as PCIe. While these are important tools for the system designer, many do not fully understand them. This session , taught by some of the originators of these measurements, digs deep into the elements of the computation, and how they relate to the actual system. Practical methods of performing the measurements which supply the required parameters will be covered, along with practical methods of measurement system de-embed.

Takeaway: Understand COM and ERL measurements and to be able to confidently perform them in the lab.


Speakers

Steve Sekel

Steve Sekel

400G/800G Specialist

Keysight Technologies

Role: Speaker

Richard Mellitz

Richard Mellitz

Distinguished Engineer

Samtec

Role: Speaker

Robert Schaefer

Robert Schaefer

R&D Project Manager

Keysight

Role: Speaker

Mike Resso

Mike Resso

SI Application Scientist

Keysight Technologies

Role: Speaker

Edward Sayre

Edward Sayre

Distinguished System Engineer

Samtec

Role: Speaker