Preparing to Test USB 3.2 and Next-gen Type-C Technologies

Wed. January 30| 10:15 AM - 10:55 AM | Great America 1

Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass, Boot Camp Pass, Expo Pass

Track: Sponsored Sessions

Audience Level: Intermediate

Session Type: Sponsored Session

Description: The USB Type-C connector has significant adoption with standards like USB, Thunderbolt, DP, and HDMI utilizing this connector.
This session will review requirements for testing USB 3.2 and next-gen Type-C technologies. As faster signals get sent through more Type-C wires and longer cables, new measurement techniques are required to test repeaters, active cables, and also comprehend crosstalk. We will review these new measurement solutions and ultra-low noise test instruments required to properly characterize these next-gen signals.
NOTE: USB Type-C™ and USB-C™ are trademarks of USB Implementers Forum.
ThunderboltTM and the Thunderbolt logo are trademarks of Intel Corporation or its subsidiaries in the U.S. and/or other countries.


Session Sponsor


Speakers

Jit Lim

Jit Lim

Standards and Solutions Lead for USB and Thunderbolt

Keysight Technologies

Role: Speaker